FISCHERSCOPE® X-RAY XAN® 215
The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals.
It is particularly suited for the analysis of precious metals and their alloys in composition and coating thickness. Up to 24 elements can be determined simultaneously.
Typical fields of application are the analysis of :
-. Jewelry, precious metals and dental alloys
-. Yellow and white gold
-. Platinum and silver
-. Rhodium
-. Alloys and coatings
-. Multi layer coatings
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
The modern silicon PIN detector achieves high accuracy and good detection sensitivity.
The fundamental parameter method by Fischer allows for the analysis of solid and liquid specimens as well as coating systems without calibration.
Electrical Data
Power supply : AC 100 – 240 V ±10 % / 50 – 60 Hz max. 120 VA, without evaluation PC
Protection class : IP40
Dimensions
External dimensions : Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4
Weight : Approx. 45 kg (99 lb)
Environmental Conditions
Operating temperature : 10 °C – 40 °C (50 °F – 104 °F)
Storage/Transport temperature : 0 °C – 50 °C (32 °F – 122 °F)
Admissible air humidity : ≤ 95 %, non-condensing
Evaluation Unit
Computer : Windows®-PC
Software :
-. Standard : Fischer WinFTM® BASIC including PDM®
-. Optional : Fischer WinFTM® SUPER
Standards
CE approval : EN 61010, EN 61326
X-Ray standards : DIN ISO 3497 and ASTM B 568
Approval : Fully protected instrument with type approval according to German radiation
protection law.
Order
FISCHERSCOPE X-RAY XAN 215 : 605-083
-. 605-692, contains all calibrated measurement applications necessary for the
analysis of jewelry, coins and precious metals
-. Special XDV product modification and XDV technical consultation on request
952-097 2022-05-10
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