FISCHERSCOPE® X-RAY XDL®
Description
The FISCHERSCOPE X-RAY XDL are universally applicable energy dispersive xray measuring instruments. They are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis.
The instruments are well suited for measurements in quality assurance, incoming inspection and process control.
Typical fields of application:
-. Measurement of electroplated mass-produced parts
-. Inspection of thin coatings, e.g., decorative chromium-plating
-. Analysis of functional coatings in the electronics and semiconductor industries
-. Automated measurements, e.g., on printed circuit boards
-. Solution analysis in the electroplating
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements.
The fundamental parameter method by Fischer allows for the analysis of solid and liquid specimens as well as coating systems without calibration.
Design
The FISCHERSCOPE X-RAY XDL instruments are modularly designed as user friendly bench-top instruments. According to the intended use, different versions are available with different support stages and with fixed or adjustable Z-axis.
-. XDL 210: Plane support stage, fixed Z-axis
-. XDL 220: Plane support stage, motor-driven Z-axis
-. XDL 230: Manually operable XY-stage, motor-driven Z-axis
-. XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
A high-resolution color video camera simplifies the precise determination of the
measurement spot.
In models equipped with a XY-stage a laser pointer serves as a positioning aid and supports the quick alignment of the sample to be measured. The housing features a slot in the side allowing for the measurement of even large components, e.g., pc-boards.
The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC, using the powerful and user-friendly WinFTM® software.
The FISCHERSCOPE XDL fulfills DIN ISO 3497 and ASTM B 568. It is a fully protected instrument with type approval according to German radiation protection law.
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